完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 林仕賢 | en_US |
dc.contributor.author | Lin, Shih-Shian | en_US |
dc.contributor.author | 吳光雄 | en_US |
dc.contributor.author | Wu, Kaung-Hsiung | en_US |
dc.date.accessioned | 2014-12-12T01:49:17Z | - |
dc.date.available | 2014-12-12T01:49:17Z | - |
dc.date.issued | 2010 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#GT079821506 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/47437 | - |
dc.description.abstract | 我們成功地建立了一套高解析度的遠場光學顯微鏡。此套光學顯微鏡可突破光學的繞射極限,並亦可觀測非螢光物體,且不破壞樣品。此外,本遠場光學顯微鏡使用波長為473 nm的探測光源,與NA為0.8的物鏡,目前卻可觀測到150 nm的樣品結構,並達到10 nm的高解析度。本論文中所量測的樣品,為利用鋁鍍在ITO基板上的物體結構,做為實驗測試,且我們的理論已經被成功地驗證。 | zh_TW |
dc.description.abstract | We successfully set up a high resolution far-field optical microscope, which can break through the optical diffraction limit, observe the non-fluorescence, and non-destroy the sample. In addition, the far-field optical microscope use the wavelength 473 nm to be the probing source with objective (NA=0.8), but it can observe the sample structure with 150 nm now, and the image resolution also achieved 10 nm. In the thesis, we implement it with a sample which is aluminum coated on indium tin oxide (ITO), and our theory had been proved by the testing sample. | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 高解析度 | zh_TW |
dc.subject | 遠場光學 | zh_TW |
dc.subject | 光學顯微鏡 | zh_TW |
dc.subject | high resolution | en_US |
dc.subject | far-field optics | en_US |
dc.subject | optical microscope | en_US |
dc.title | 突破繞射極限之超解析遠場光學顯微鏡 | zh_TW |
dc.title | Ultra-Resolution Far-Field Optical Microscope beyond the Diffraction Limitation | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 電子物理系所 | zh_TW |
顯示於類別: | 畢業論文 |