标题: | 以分子束磊晶成长之氧化锰锌薄膜的光学特性研究 Optical properties of ZnMnO thin films grown by molecular beam epitaxy |
作者: | 杨侑霖 Yang, Yu-Lin 周武清 Chou, Wu-Ching 电子物理系所 |
关键字: | 氧化锰锌;分子束磊晶;ZnMnO;Molecular beam epitaxy |
公开日期: | 2012 |
摘要: | 本篇论文利用分子束磊晶系统在蓝宝石基板上成长氧化锌、氧化锰锌薄膜。由X光绕射的实验结果得知薄膜均为c轴方向的成长而且没有第二相的产生。穿透光谱显示氧化锰锌的能隙随着掺杂锰浓度的增加而有蓝位移的趋势。在共振拉曼光谱中我们发现氧化锌样品和氧化锰锌样品各自有5个和11个纵向光学声子的讯号。藉由变温共振拉曼光谱的实验,可以得知纵向光学声子讯号的强度与氧化锰锌的能隙位置相关。除此之外,我们也对掺杂锰浓度0.3 %的氧化锰锌薄膜量测在磁场下的光激萤光光谱,在0 T和0.3 T时分别有0 %和1.4 %的圆形极化率。 Zn1-xMnxO (x = 0 ~ 0.03) thin films were grown by molecular beam epitaxy (MBE) system. X-ray diffraction (XRD) result reveals that these samples are all grown along c-axis and there are no second phases. Transmittance shows an increase of the band gap with the increasing Mn concentration. The resonant Raman scattering (RRS) spectra showed that there are 5 and 11 longitudinal optical (LO) phonon lines for ZnO and Zn1-xMnxO samples, respectively. The LO phonon line intensity is sensitive to the band gap position as shown in the RRS spectra. Furthermore, for the Zn0.997Mn0.003O sample, the circular polarization degrees are P = 0 % and 1.4 % in magnetic field B = 0 T and 0.3 T, respectively. |
URI: | http://140.113.39.130/cdrfb3/record/nctu/#GT079921528 http://hdl.handle.net/11536/49722 |
显示于类别: | Thesis |
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