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dc.contributor.authorShiu, Jian-Jhinen_US
dc.contributor.authorChen, Wei-Lien_US
dc.contributor.authorLin, Der-Yuhen_US
dc.contributor.authorYang, Chu-Shouen_US
dc.contributor.authorChou, Wu-Chingen_US
dc.date.accessioned2014-12-08T15:06:25Z-
dc.date.available2014-12-08T15:06:25Z-
dc.date.issued2007-04-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.46.2481en_US
dc.identifier.urihttp://hdl.handle.net/11536/4981-
dc.description.abstractThe optical characterization of type-II Zn0.97Mn0.03Se/ZnSe0.92Te0.08 multiple-quantum-well structures has been studied using photoluminescence (PL), temperature-dependent PL, and power-dependent PL. The PL data reveal that the band alignment of the ZnMnSe/ZnSeTe multiple quantum wells (MQWs) is type II. In comparison with the theoretical calculation based on solving the Schrodinger equation of a square potential well, the valence band offset is estimated to be 0.6 eV. From the power-dependent PL spectra, it is observed that the peak position of PL spectra shows a blue shift on increasing the excitation power. The blue shift can be interpreted in terms of the band-bending effect due to spatially separated carriers in a type-II alignment and the band filling effect. The thermal activation energy (EA) for quenching the PL intensity was determined from temperature-dependent PL spectra. The thermal activation energy was found to decrease as the thickness of ZnMnSe or ZnSeTe layers decreased.en_US
dc.language.isoen_USen_US
dc.subjectphotoluminescenceen_US
dc.subjectZnMnSeen_US
dc.subjectZnSeTeen_US
dc.subjectthermal activation energyen_US
dc.subjectmultiple quantum wellen_US
dc.titlePhotoluminescence characterization of type-II Zn0.97Mn0.03Se/ZnSe0.92Te0.08 multiple-quantum-well structuresen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1143/JJAP.46.2481en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERSen_US
dc.citation.volume46en_US
dc.citation.issue4Ben_US
dc.citation.spage2481en_US
dc.citation.epage2485en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000247050200139-
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