DESIGN OF IMPROVED FAILURE DETECTION EXPERIMENTS IN SYNCHRONOUS SEQUENTIAL-MACHINES BASED ON TERMINAL MEASUREMENTS

Full metadata record

DC Field	Value	Language
dc.contributor.author	DAS, SR	en_US
dc.contributor.author	CHEN, Z	en_US
dc.contributor.author	WU, SM	en_US
dc.contributor.author	LEE, SY	en_US
dc.contributor.author	BHATTACHARYYA, A	en_US
dc.date.accessioned	2014-12-08T15:06:31Z	-
dc.date.available	2014-12-08T15:06:31Z	-
dc.date.issued	1979	en_US
dc.identifier.issn	0045-7906	en_US
dc.identifier.uri	http://hdl.handle.net/11536/5080	-
dc.language.iso	en_US	en_US
dc.title	DESIGN OF IMPROVED FAILURE DETECTION EXPERIMENTS IN SYNCHRONOUS SEQUENTIAL-MACHINES BASED ON TERMINAL MEASUREMENTS	en_US
dc.type	Article	en_US
dc.identifier.journal	COMPUTERS & ELECTRICAL ENGINEERING	en_US
dc.citation.volume	6	en_US
dc.citation.issue	4	en_US
dc.citation.spage	293	en_US
dc.citation.epage	297	en_US
dc.contributor.department	交大名義發表	zh_TW
dc.contributor.department	資訊工程學系	zh_TW
dc.contributor.department	National Chiao Tung University	en_US
dc.contributor.department	Department of Computer Science	en_US
dc.identifier.wosnumber	WOS:A1979HX77800008	-
dc.citation.woscount	2	-
Appears in Collections:	Articles