SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM

Full metadata record

DC Field	Value	Language
dc.contributor.author	LEI, TF	en_US
dc.contributor.author	LEE, CL	en_US
dc.contributor.author	CHANG, CY	en_US
dc.date.accessioned	2014-12-08T15:06:32Z	-
dc.date.available	2014-12-08T15:06:32Z	-
dc.date.issued	1978	en_US
dc.identifier.issn	0038-1101	en_US
dc.identifier.uri	http://hdl.handle.net/11536/5113	-
dc.language.iso	en_US	en_US
dc.title	SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM	en_US
dc.type	Article	en_US
dc.identifier.journal	SOLID-STATE ELECTRONICS	en_US
dc.citation.volume	21	en_US
dc.citation.issue	2	en_US
dc.citation.spage	385	en_US
dc.citation.epage	391	en_US
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1978ES98800008	-
dc.citation.woscount	4	-
Appears in Collections:	Articles

APA	LEI, T., LEE, C., & CHANG, C. (1978). SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM. WOS:A1978ES98800008.
Bibtex	@article{LEI1978SPECIFIC, title={SPECIFIC CONTACT RESISTANCE OF NI-AU-GE-NGAP SYSTEM}, author={LEI, TF and LEE, CL and CHANG, CY}, journal={WOS:A1978ES98800008}, year={1978}, url={https://ir.lib.nycu.edu.tw/handle/11536/5113?mode=full}, }