完整後設資料紀錄
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dc.contributor.authorNakata, Takamichien_US
dc.contributor.authorYoshitake, Hiroakien_US
dc.contributor.authorWakino, Kikuoen_US
dc.contributor.authorLin, Yu-Deen_US
dc.contributor.authorTani, Tohruen_US
dc.contributor.authorKitazawa, Toshihideen_US
dc.date.accessioned2014-12-08T15:06:43Z-
dc.date.available2014-12-08T15:06:43Z-
dc.date.issued2007-02-01en_US
dc.identifier.issn0916-8524en_US
dc.identifier.urihttp://dx.doi.org/10.1093/ietele/e90-c.2.275en_US
dc.identifier.urihttp://hdl.handle.net/11536/5268-
dc.description.abstractThe extended version of spectral domain approach (ESDA) is applied to evaluate the scattering characteristics of discontinuities in coaxial line. Discontinuities may be in inner and/or outer conductor of coaxial line. This method secures the high accuracy by considering the singularities of fields near the conductor edge properly. The computational labor of the new method is far lighter than that of FEM, so that novel method is suitable for the time consuming iterative computation such as fitting procedure in material evaluation or optimization of antenna design.en_US
dc.language.isoen_USen_US
dc.subjectdiscontinuities in coaxial lineen_US
dc.subjectscattering characteristicsen_US
dc.subjectspectral domain approachen_US
dc.subjectGalerkin's procedureen_US
dc.titleSpectral domain approach to the scattering analysis of coaxial discontinuitiesen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1093/ietele/e90-c.2.275en_US
dc.identifier.journalIEICE TRANSACTIONS ON ELECTRONICSen_US
dc.citation.volumeE90Cen_US
dc.citation.issue2en_US
dc.citation.spage275en_US
dc.citation.epage281en_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.identifier.wosnumberWOS:000244546800010-
顯示於類別:會議論文