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dc.contributor.authorChang, Liang-Juanen_US
dc.contributor.authorChen, Kuan-Yuen_US
dc.contributor.authorLin, Lu-Kuien_US
dc.contributor.authorYao, Yeong Deren_US
dc.contributor.authorLin, Pangen_US
dc.contributor.authorLee, Shang Fanen_US
dc.date.accessioned2014-12-08T15:06:47Z-
dc.date.available2014-12-08T15:06:47Z-
dc.date.issued2010-06-01en_US
dc.identifier.issn0018-9464en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TMAG.2010.2040593en_US
dc.identifier.urihttp://hdl.handle.net/11536/5319-
dc.description.abstractThe magnetization reversal processes of single-layer nanoscale elliptical ring arrays are examined. The magnetic field was applied parallel or perpendicular to the long axis. The magnetization hysteresis loops showed a simultaneous-reversal single-step transition or two-step transition involving flux closure vortex states. For various aspect ratios and thicknesses, the transition between single-step and double-step magnetization reversals was measured to form phase diagrams. Simulations of the magnetization reversal behavior agreed with our results.en_US
dc.language.isoen_USen_US
dc.subjectMagnetic filmsen_US
dc.subjectmagnetooptic Kerr effecten_US
dc.titleMagnetization Reversal Characteristics in NiFe Elliptical Ring Arraysen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TMAG.2010.2040593en_US
dc.identifier.journalIEEE TRANSACTIONS ON MAGNETICSen_US
dc.citation.volume46en_US
dc.citation.issue6en_US
dc.citation.spage1975en_US
dc.citation.epage1977en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000278037800181-
dc.citation.woscount0-
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