標題: | Direct Observation of Electron Dephasing due to Inelastic Scattering from Defects in Weakly Disordered AuPd Wires |
作者: | Zhong, Yuan-Liang Sergeev, Andrei Chen, Chii-Dong Lin, Juhn-Jong 電子物理學系 物理研究所 Department of Electrophysics Institute of Physics |
公開日期: | 21-五月-2010 |
摘要: | To identify and investigate the mechanisms of electron-phonon (e-ph) relaxation in weakly disordered metallic conductors, we measure the electron dephasing rate in a series of suspended and supported 15-nm thick AuPd wires. In a wide temperature range, from similar to 8 K to above 20 K, the e-ph interaction dominates in the dephasing processes. The corresponding relaxation rate reveals a quadratic temperature dependence, tau(-1)(e-ph) = A(ep)T(2), where A(ep) approximate to 5 x 10(9) K(-2) s(-1) is essentially the same for all samples studied. Our observations are shown to be in good agreement with the theory which predicts that, even in weakly disordered metallic structures at moderately low temperatures, the major mechanism of the e-ph relaxation is the electron scattering from vibrating defects and impurities. |
URI: | http://dx.doi.org/10.1103/PhysRevLett.104.206803 http://hdl.handle.net/11536/5392 |
ISSN: | 0031-9007 |
DOI: | 10.1103/PhysRevLett.104.206803 |
期刊: | PHYSICAL REVIEW LETTERS |
Volume: | 104 |
Issue: | 20 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 期刊論文 |