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dc.contributor.authorChang, Chih-Weien_US
dc.contributor.authorChiou, Jin-Chernen_US
dc.date.accessioned2014-12-08T15:07:01Z-
dc.date.available2014-12-08T15:07:01Z-
dc.date.issued2010-05-01en_US
dc.identifier.issn1424-8220en_US
dc.identifier.urihttp://dx.doi.org/10.3390/s100504238en_US
dc.identifier.urihttp://hdl.handle.net/11536/5483-
dc.description.abstractThis study reports a new stacking method for assembling a 3-D microprobe array. To date, 3-D array structures have usually been assembled with vertical spacers, snap fasteners and a supporting platform. Such methods have achieved 3-D structures but suffer from complex assembly steps, vertical interconnection for 3-D signal transmission, low structure strength and large implantable opening. By applying the proposed stacking method, the previous techniques could be replaced by 2-D wire bonding. In this way, supporting platforms with slots and vertical spacers were no longer needed. Furthermore, ASIC chips can be substituted for the spacers in the stacked arrays to achieve system integration, design flexibility and volume usage efficiency. To avoid overflow of the adhesive fluid during assembly, an anti-overflow design which made use of capillary action force was applied in the stacking method as well. Moreover, presented stacking procedure consumes only 35 minutes in average for a 4 x 4 3-D microprobe array without requiring other specially made assembly tools. To summarize, the advantages of the proposed stacking method for 3-D array assembly include simplified assembly process, high structure strength, smaller opening area and integration ability with active circuits. This stacking assembly technique allows an alternative method to create 3-D structures from planar components.en_US
dc.language.isoen_USen_US
dc.subjectmicroassemblyen_US
dc.subjectmicroprobe arrayen_US
dc.subjectthree dimensional probe arrayen_US
dc.titleDevelopment of a Three Dimensional Neural Sensing Device by a Stacking Methoden_US
dc.typeArticleen_US
dc.identifier.doi10.3390/s100504238en_US
dc.identifier.journalSENSORSen_US
dc.citation.volume10en_US
dc.citation.issue5en_US
dc.citation.spage4238en_US
dc.citation.epage4252en_US
dc.contributor.department電機工程學系zh_TW
dc.contributor.departmentDepartment of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000278105100004-
dc.citation.woscount5-
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