Full metadata record
DC FieldValueLanguage
dc.contributor.authorLin, Chen-juen_US
dc.contributor.authorPearn, W. L.en_US
dc.date.accessioned2014-12-08T15:07:07Z-
dc.date.available2014-12-08T15:07:07Z-
dc.date.issued2010-04-01en_US
dc.identifier.issn0748-8017en_US
dc.identifier.urihttp://dx.doi.org/10.1002/qre.1051en_US
dc.identifier.urihttp://hdl.handle.net/11536/5577-
dc.description.abstractProcess selection is the problem of comparing two processes and selecting the one that has a higher capability value. In this paper, we consider the process selection problem by using the yield index S(pk) to compare two production processes and select one that has higher production yield. An analytical exact approach is proposed to solve this problem. Testing hypotheses with two phases for comparing two processes are developed. Critical values of the test are obtained to determine the selection decisions. Sample sizes required for designated selection power and confidence level are also investigated. The results provide useful information to practitioners. An application example on comparing two thin-film transistor (TFT) type liquid-crystal display (LCD) production processes is presented to illustrate the practicality of the proposed approach to a real problem in the factory. Copyright (C) 2009 John Wiley & Sons, Ltd.en_US
dc.language.isoen_USen_US
dc.titleProcess Selection for Higher Production Yield Based on Capability Index S(pk)en_US
dc.typeArticleen_US
dc.identifier.doi10.1002/qre.1051en_US
dc.identifier.journalQUALITY AND RELIABILITY ENGINEERING INTERNATIONALen_US
dc.citation.volume26en_US
dc.citation.issue3en_US
dc.citation.spage247en_US
dc.citation.epage258en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
Appears in Collections:Articles