Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 陳慶緒 | en_US |
dc.contributor.author | CHEN, QING-XU | en_US |
dc.contributor.author | 謝文峰 | en_US |
dc.contributor.author | 楊宗哲 | en_US |
dc.contributor.author | XIE, WEN-FENG | en_US |
dc.contributor.author | YANG, ZHONG-ZHE | en_US |
dc.date.accessioned | 2014-12-12T02:09:23Z | - |
dc.date.available | 2014-12-12T02:09:23Z | - |
dc.date.issued | 1991 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#NT802429002 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/55999 | - |
dc.description.abstract | 我們利用單光束及雙光束雷射蒸鍍硫化鎘微晶玻璃薄膜在顯微鏡蓋玻片上,實驗所 用的雷射是 Nd:YAG Q-開關脈衝雷射,二諧波波長 532nm,脈衝寬度8nsec ,脈衝 重覆率20Hz,單光束所採用的靶是CdS 與 SiO□混合的壓片,雙光束則採用SiO 和 CdS 分離的兩個壓片。 紅外光譜顯示兩種方法所做的樣品皆有 SiO□成份,而雙光束所做的樣品則有穿透 光譜和螢光光譜藍位移的現象,這是量子弱侷限效應的結果,然而掃描式電子顯微 鏡照片和拉曼光譜的硫化鎘第一階縱向光模態聲子的尖峰位移現象則顯示樣品的硫 化鎘顆粒大小分佈不均勻。 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.subject | 硫化鎘 | zh_TW |
dc.subject | 雷射 | zh_TW |
dc.subject | 螢光光譜 | zh_TW |
dc.title | 雷射蒸鍍硫化鎘微晶玻璃薄膜及其特性分析 | zh_TW |
dc.title | The characterization of Cds doped glass thin films by pulsed laser evaporation | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 電子物理系所 | zh_TW |
Appears in Collections: | Thesis |