Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 賴志誠 | en_US |
dc.contributor.author | LAI, ZHI-CHENG | en_US |
dc.contributor.author | 郭義雄 | en_US |
dc.contributor.author | 吳光雄 | en_US |
dc.contributor.author | GUO, YI-XIONG | en_US |
dc.contributor.author | WU, GUANG-XIONG | en_US |
dc.date.accessioned | 2014-12-12T02:09:23Z | - |
dc.date.available | 2014-12-12T02:09:23Z | - |
dc.date.issued | 1991 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#NT802429008 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/56007 | - |
dc.description.abstract | 雷射製備釔系高溫超導薄膜於已鍍YSZ 緩衝層 (buffer layer) 之矽(100) 基板上 之最佳蒸鍍條件已被有系統底研究。吾人發現YSZ 緩衝層可於真空條件中即時以雷 射蒸鍍於矽基板上,且高品質的釔系高溫超導薄膜在不須破壞真空條件下可隨後被 蒸鍍於其上。吾人現已成功底於 YSZ/Si (100) 上製備出超導臨界溫度為85K;臨界 電流密度在77K > 2.0×10□A/cm□,在20K > 2.0×10 A/cm□的釔系超導薄膜 ,其中YSZ 緩衝層於 830℃製成,其厚度約800 埃。緩衝層的厚度和其即時退火處 理是獲得高品質釔系超導薄膜的重要條件。薄膜拉曼(Raman) 光譜分析進一步指出 YBCO/YSZ/Si(100)易形成弱軸向 (weak-epitaxy) 成長,因此YSZ 緩衝層厚度的控 制和其結晶性質為獲得高品質釔系超導薄膜之必要條件。基板╱緩衝層和超導薄膜 ╱緩衝層的界面反應對超導薄膜的影響亦加以討論。 | zh_TW |
dc.language.iso | en_US | en_US |
dc.subject | 緩衝層 | zh_TW |
dc.subject | 釔系 | zh_TW |
dc.subject | 超導薄膜 | zh_TW |
dc.subject | 結晶性 | zh_TW |
dc.title | 利用準分子脈衝雷射蒸鍍法即時製備釔系高溫超導薄膜於鍍YSZ緩衝層之矽基板 | zh_TW |
dc.title | In-situ deposition of superconducting YBCO films on Si(100) with YSZ buffer layers by pulsed excimer laser ablation | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 電子物理系所 | zh_TW |
Appears in Collections: | Thesis |