Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | YEH, YC | en_US |
dc.contributor.author | SHENG, CL | en_US |
dc.date.accessioned | 2014-12-08T15:07:13Z | - |
dc.date.available | 2014-12-08T15:07:13Z | - |
dc.date.issued | 1974-01-01 | en_US |
dc.identifier.issn | 0018-9529 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/5682 | - |
dc.description.abstract | en_US | |
dc.language.iso | en_US | en_US |
dc.title | NEW RELIABILITY FUNCTION | en_US |
dc.type | Note | en_US |
dc.identifier.journal | IEEE TRANSACTIONS ON RELIABILITY | en_US |
dc.citation.volume | R 23 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | 118 | en_US |
dc.citation.epage | 123 | en_US |
dc.contributor.department | 交大名義發表 | zh_TW |
dc.contributor.department | National Chiao Tung University | en_US |
Appears in Collections: | Articles |