MULTIPLE FAULT DETECTION IN COMBINATIONAL CIRCUITS - ALGORITHMS AND COMPUTATIONAL RESULTS

Full metadata record

DC Field	Value	Language
dc.contributor.author	DU, MW	en_US
dc.contributor.author	WEISS, CD	en_US
dc.date.accessioned	2014-12-08T15:07:14Z	-
dc.date.available	2014-12-08T15:07:14Z	-
dc.date.issued	1973-01-01	en_US
dc.identifier.issn	0018-9340	en_US
dc.identifier.uri	http://hdl.handle.net/11536/5699	-
dc.description.abstract		en_US
dc.language.iso	en_US	en_US
dc.title	MULTIPLE FAULT DETECTION IN COMBINATIONAL CIRCUITS - ALGORITHMS AND COMPUTATIONAL RESULTS	en_US
dc.type	Article	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON COMPUTERS	en_US
dc.citation.volume	C 22	en_US
dc.citation.issue	3	en_US
dc.citation.spage	235	en_US
dc.citation.epage	240	en_US
dc.contributor.department	工學院	zh_TW
dc.contributor.department	College of Engineering	en_US
Appears in Collections:	Articles