Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chin, A | en_US |
dc.contributor.author | Liao, CC | en_US |
dc.contributor.author | Chu, J | en_US |
dc.contributor.author | Li, SS | en_US |
dc.date.accessioned | 2014-12-08T15:01:48Z | - |
dc.date.available | 2014-12-08T15:01:48Z | - |
dc.date.issued | 1997-05-01 | en_US |
dc.identifier.issn | 0022-0248 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/S0022-0248(96)00922-0 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/569 | - |
dc.description.abstract | We have studied two Si-doped p-type quantum well infrared photodetectors (QWIPs) using AlGaAs/GaAs and AlGaAs/InGaAs grown on (3 1 1)A GaAs. The Si-doped AlGaAs/GaAs p-QWIP exhibits a symmetrical dark I-V characteristic at all the measured temperatures from 40 to 120 K. The strained p-type AlGaAs/InGaAs QWIP exhibits a slightly asymmetrical dark I-V characteristic, but is markedly less asymmetrical than that doped with beryllium. The slight asymmetry in dark I-V characteristic and the large blue-shift in responsivity spectra may be due to the thickness modulation observed from TEM and the red-shift of PL peak energy, where PL peak energies from (3 1 1)A AlGaAs/InGaAs multiple quantum wells are red-shifts of 7 and 22 meV to the side-by-side grown (1 0 0). | en_US |
dc.language.iso | en_US | en_US |
dc.title | Investigation of Si-doped p-type AlGaAs/GaAs, AlGaAs/InGaAs quantum well infrared photodetectors and multiquantum wells grown on (311)A GaAs | en_US |
dc.type | Article; Proceedings Paper | en_US |
dc.identifier.doi | 10.1016/S0022-0248(96)00922-0 | en_US |
dc.identifier.journal | JOURNAL OF CRYSTAL GROWTH | en_US |
dc.citation.volume | 175 | en_US |
dc.citation.issue | en_US | |
dc.citation.spage | 999 | en_US |
dc.citation.epage | 1003 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:A1997XX17900057 | - |
Appears in Collections: | Conferences Paper |
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