利用外差式干涉術來測量波片的相位延遲及方位角

Abstract

本論文提出一種光學技術來同時測量波片的相位延遲及方位角．這個 不 但結合了外差干涉術與共光程干涉儀的優點，並且還能即時顯示測量果． 首先利用電光晶體調制器當做移頻器，來達到外差檢測的目的．其A因為 參考訊號與測試訊號間的相位差值是波片的相位延遲及方位角的，所以藉 由分析這個函數，我們可以經由一些步驟將波片的相位延遲閬鴩丹P步的 測量出來．實驗結果與理論計算非常吻合． In this paper, we propose an optical technique to measure thease retardation and the azimuth angle of a wave plately. This technique not only combines both the meritsdyne interferometer and the common pathbut also shows the measurement results in realall, EO modulator functions as a frequency shifterrodyne interference which is caused by composingand test beam. Secondly, because the phaseeen reference beam and test beam is the functionation and azimuth angle of a wave plate, so we canse retardation and the azimuth of a wave plate aty some processes described in this paper. dings and computed results give a quitereement.