使用二元樹和多元樹來做自動測試圖樣產生器

Abstract

在本論文中，我們分別以二元樹和多元樹來產生非序向邏輯電路的測試圖 樣。此種方法對於產生難測障礙的測試圖樣和確認冗餘障礙擁有非常好的 效果。當我們以此方法對某一特定障礙產生測試圖樣時，在樹中有許多路 徑並不能激發障礙效應。因此在多元樹中我們提出 N訊號來遮蔽這些不能 激發障礙效應的路徑，期望能降低障礙效應傳往輸出端的運算複雜度。由 實驗證明，此策略對於那些把 N訊號置於較高次序的障礙非常地有效，因 它大大地降低了樹之間的運算複雜度。 In this thesis, we use the Binary Decision Diagram (BDD) and Multiple Terminated Binary Decision Diagram (MTBDD) to generate the test patterns for combinational circuits. This approach is very efficient to generate tests for the hard-to- detected faults and to identify redundant faults. During the test generation for a target fault in this method, there are many paths which do not activate the fault, an N signal in MTBDD is proposed to mask these paths to reduce the complexity of the BDD operations when propagating the faulty effect toward POs. Experimental results show that this strategy is very efficient for those faults to reduce computation which the N signals are in the higher order of the MTBDD tree.