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dc.contributor.authorLin, Wei-Hsunen_US
dc.contributor.authorTseng, Chi-Cheen_US
dc.contributor.authorChao, Kuang-Pingen_US
dc.contributor.authorMai, Shu-Chengen_US
dc.contributor.authorLin, Shih-Yenen_US
dc.contributor.authorWu, Meng-Chyien_US
dc.date.accessioned2014-12-08T15:07:24Z-
dc.date.available2014-12-08T15:07:24Z-
dc.date.issued2010-02-15en_US
dc.identifier.issn1041-1135en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LPT.2009.2037727en_US
dc.identifier.urihttp://hdl.handle.net/11536/5841-
dc.description.abstractQuantum-dot infrared photodetectors (QDIPs) with InGaAs capping layers are investigated. Compared with the standard QDIP with 2.5-mono-layer (ML) InAs QDs, the detection wavelength is shifted from 6 to 7.9 m for an 8-nm InGaAs-capped QDIP. By decreasing the QD coverage from 2.5 to 2.0 ML, an even longer detection wavelength 10.4 m is observed, which is attributed to the higher energy levels of the QD excited states resulted from the smaller QDs. By further increasing the capping layer thickness to 12 nm, longer detection wavelengths with broad response 10-18 m is observed for the InGaAs-capped QDIP.en_US
dc.language.isoen_USen_US
dc.subjectQuantum-dot infrared photodetectors (QDIPs)en_US
dc.titleWavelength-Tunable InGaAs-Capped Quantum-Dot Infrared Photodetectorsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LPT.2009.2037727en_US
dc.identifier.journalIEEE PHOTONICS TECHNOLOGY LETTERSen_US
dc.citation.volume22en_US
dc.citation.issue4en_US
dc.citation.spage227en_US
dc.citation.epage229en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000275381000005-
dc.citation.woscount0-
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