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dc.contributor.author涂結盛en_US
dc.contributor.authorTu, Jie-Shengen_US
dc.contributor.author辛偉en_US
dc.contributor.author高曜煌en_US
dc.contributor.authorXin, Weien_US
dc.contributor.authorGao-Yue, Huangen_US
dc.date.accessioned2014-12-12T02:14:28Z-
dc.date.available2014-12-12T02:14:28Z-
dc.date.issued1994en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT834435001en_US
dc.identifier.urihttp://hdl.handle.net/11536/59917-
dc.description.abstract我們利用了電子束微影系統來製作我們要的二階光柵.在這製作過程中,我 們利用了兩種阻液, 一個為正光阻ZEP520, 一個為負光阻 SAL601 ER-7在 這製作過程中, 會因為我們所選的阻液之感光度的不同以及電子本身的一 些特性和碎片晶片對焦的問題, 導至我們最初實驗的結果不甚理想 ,我們 將提出一些改進的方法 .最後我們將把成功的二階光柵的各個參數及電子 顯微鏡所拍的二階光柵的圖型列出來, 以做為將來製作一階光柵及圓形光 柵的一個參考的依據 . We fabricate 2nd order grating of DFB laser by E-beam lithograp- hy . We choose two kinds of resist , one is positive resist ZEP- 520 , another is negative resist SAl 601 ER-7 . In our fabricay- ion process will be strongly affected by electron scattering and focusing of the e-beam . We will offer some improvement methods. Finally,we show our successful grating SEM picture and thier pa- rameters . It will be served as a guide line for developing the 1st order grating or circular grating in the future .zh_TW
dc.language.isoen_USen_US
dc.subject二階光柵zh_TW
dc.subject電子束微影zh_TW
dc.subject半導體雷射關鍵字: 電信zh_TW
dc.subject電子工程zh_TW
dc.subject電信zh_TW
dc.subject"DFBen_US
dc.subjectGRATINGen_US
dc.subjectE-BEAM LITHOGRAPHYALEICA EBL-3en_US
dc.subjectTELECOMMUNICATIONen_US
dc.subjectELECTRONIC-ENGINEERINGen_US
dc.subjectGratingen_US
dc.subjectE-Beam Lithographyen_US
dc.subjectLeica EBL-300en_US
dc.subjectDFB,Grating,E-Beam Lithography,Leica EBL-300,"en_US
dc.title利用電子束微影系統製作分佈回饋半導體雷射的二階光柵zh_TW
dc.title2nd order DFB laser grating fabrication by E-beam lithographyen_US
dc.typeThesisen_US
dc.contributor.department電信工程研究所zh_TW
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