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dc.contributor.author林志光en_US
dc.contributor.author張俊彥en_US
dc.date.accessioned2014-12-12T02:14:30Z-
dc.date.available2014-12-12T02:14:30Z-
dc.date.issued1994en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT836430103en_US
dc.identifier.urihttp://hdl.handle.net/11536/59946-
dc.language.isozh_TWen_US
dc.title半導體非揮發性記憶體元件的可程式性及可靠性的研究zh_TW
dc.titleProgrammability and reliability of semiconductor nonvolatile memory devicesen_US
dc.typeThesisen_US
dc.contributor.department電子研究所zh_TW
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