A method for measuring the geometrical topography of a Rockwell diamond indenter

doi:10.1088/0957-0233/21/1/015307

Full metadata record

DC Field	Value	Language
dc.contributor.author	Chen, Yen-Liang	en_US
dc.contributor.author	Su, Der-Chin	en_US
dc.date.accessioned	2014-12-08T15:07:48Z	-
dc.date.available	2014-12-08T15:07:48Z	-
dc.date.issued	2010-01-01	en_US
dc.identifier.issn	0957-0233	en_US
dc.identifier.uri	http://dx.doi.org/10.1088/0957-0233/21/1/015307	en_US
dc.identifier.uri	http://hdl.handle.net/11536/6141	-
dc.description.abstract	Firstly, a Rockwell diamond indenter tip is tested at different angles and positions by using a scanning white light interferometer, and several image data are obtained. Then, these data are merged together to form the associated geometrical topography with the image stitching method. Moreover, both the tip radius and the cone angle can be obtained with the least-squares Gauss-Newton sphere and cone fitting algorithm. Its validity is demonstrated.	en_US
dc.language.iso	en_US	en_US
dc.subject	white light interferometer	en_US
dc.subject	image stitching method	en_US
dc.subject	Rockwell diamond indenter	en_US
dc.subject	surface topography	en_US
dc.subject	Mirau interferometer	en_US
dc.title	A method for measuring the geometrical topography of a Rockwell diamond indenter	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1088/0957-0233/21/1/015307	en_US
dc.identifier.journal	MEASUREMENT SCIENCE & TECHNOLOGY	en_US
dc.citation.volume	21	en_US
dc.citation.issue	1	en_US
dc.citation.epage		en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000272610300026	-
dc.citation.woscount	2	-
Appears in Collections:	Articles

Files in This Item:

000272610300026.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.