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dc.contributor.author王士瑋en_US
dc.contributor.authorWANG, SHIH-WEIen_US
dc.contributor.author張國明en_US
dc.contributor.authorKOW-MING CHANGen_US
dc.date.accessioned2014-12-12T02:17:27Z-
dc.date.available2014-12-12T02:17:27Z-
dc.date.issued1996en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT850428040en_US
dc.identifier.urihttp://hdl.handle.net/11536/61907-
dc.description.abstractnonezh_TW
dc.language.isozh_TWen_US
dc.subject電子迴旋共振zh_TW
dc.subject低介電常數zh_TW
dc.subject氟氧化矽zh_TW
dc.subjectElectron Cyclotron Resonanceen_US
dc.subjectLow Dielectric Constanten_US
dc.subjectFluorinated Silicon Oxideen_US
dc.title利用矽烷,氧氣及四氟化碳在電子迴旋共振系統中沉積之低介電常數氟氧化矽的研究zh_TW
dc.titleThe Study of Low Dielectric Constant Fluorinated Silicon Oxide, Fabricated by Electron Cyclotron Resonance System with SiH4, O2 and CF4 as Reaction Gasesen_US
dc.typeThesisen_US
dc.contributor.department電子研究所zh_TW
Appears in Collections:Thesis