Title: 在複徑衰褪的環境下非同調鎖碼迴路的功能表現
On the Behavior of Noncoherent Delay-Locked Loops in Mutipath Fading Environments
Authors: 陳家溢
Chen, Chia-Yi
蘇育德
Yu T. Su
電信工程研究所
Keywords: 展頻通訊;同步;鎖碼迴路;DS/SS;synchronization;Delay-locked loops
Issue Date: 1996
Abstract: 在直接序列展頻通訊(DS/SS)系統中,吾人常以非同調鎖碼迴路(
Noncoherent Delay-Locked Loop, DLL) 來追蹤偽亂碼(pseudo
noise code, PN code)的相位。
然而,在無線傳輸的環境下,非同調鎖碼迴路的運作不僅受到相加性高思
白雜訊 (additive Gaussian white
noise, AWGN) 的干擾,
同時也受到複徑衰退(mutipath fading)的影響。本論文主要探討的則即
是非同調鎖碼迴路在一個經簡化 後的時變通道下之行為表現。
追蹤誤差(tracking error)的暫態機率密度函數(transition
probability density function) 可以數值方法 (numerical
method) 求得,並可從中觀察同調鎖碼迴路是如何暫態運作。在此論文中
亦 詳述了在求解過程中所遇到的問題並提出解
決的方法。在此,我們的討論集中在兩個重要
的表現評估參數上: 一為鎖碼迴路能夠維持鎖定的時間(Mean Time to
Lose Lock, MTLL); 另一個則是追蹤誤差(
tracking error)。因為相位誤差(phase error)可視為再生過程
(renewal process),所以,再生過程法(Renewal Process Approach,
RPA) 可用來分析鎖碼迴路。然而
,在時變通道下用再生過程法並無法得到合理的參數。文末,
我們並分析了一種擁有較大的拉回範圍(pull-in range)及鎖定範圍(
lock-in range)的 改良式鎖碼迴路(Improved
DLL)。
Noncoherent {\it delay-locked loops} (DLL) are often employed to
track the code phase
of the pseudo noise (PN) sequence used in a direct-sequence
spread spectrum (DS/SS) system.
In a wireless radio communication environment, the performence
of a noncoherent DLL is
affected not only by additive white Gaussian noise (AWGN) but
also by multipath fading.
This thesis investigates the behavior of noncoherent DDLs in a
class of simple time-varying fading channels.
Numerical method is used to solve the transition probability
density function (pdf) of
the tracking error and to study the transient behavior of a
noncoherent loop.
Detailed discussion on the numerical problems encountered in the
course of deriving
the desired solution is provided. {\it Mean time to lose lock}
(MTLL) and {\it tracking error} are the two major performance
measures of concern to us. Because the code phase error can be
modeled as a renewal process, {\it Renewal Process Approach}
(RPA) can be applied to analyze the performance of tracking
loops. In a time-varying channel, however, we
find that stationary analysis using RPA does not lead to correct
estimates of the MTLL
and the tracking error. We also analyze the performance of a
class of code tracking loops
called improved DLL that has a wider S-curve, larger pull-in and
lock-in ranges.
URI: http://140.113.39.130/cdrfb3/record/nctu/#NT850436051
http://hdl.handle.net/11536/62129
Appears in Collections:Thesis