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dc.contributor.author徐敏政en_US
dc.contributor.authorHsu, Min-Chengen_US
dc.contributor.author郭仁財en_US
dc.contributor.authorJen-Tsai Kuoen_US
dc.date.accessioned2014-12-12T02:17:47Z-
dc.date.available2014-12-12T02:17:47Z-
dc.date.issued1996en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT850436058en_US
dc.identifier.urihttp://hdl.handle.net/11536/62137-
dc.description.abstract本文利用全波頻域分析法,並配合適當的積分路徑變換以包含表面波 極點,來分析多重耦合微帶線上的洩漏主模態。此洩漏主模態和原來的主 模態共同存在。它們把能量以 TM0 表面波的形式,洩漏至接地基板上。 此現象可能在較高的頻率,引起微波電路偽造的效能反應。 The leaky dominant modes on multiple coupled microstrips are investigated by the full-wave spectral domain approach (SDA) with appropriate deformation of integration contours to include the surface-wave poles. These modes exist independently of the customary bound dominant mode. They leak power away fromthe lines into the fundamental TM0 surface wave of the surrounding grounded substrate and may be responsible for spurious microstrip circuit performance at higher frequencies.zh_TW
dc.language.isozh_TWen_US
dc.subject洩漏波zh_TW
dc.subject耦合微帶線zh_TW
dc.subject頻域分析法zh_TW
dc.subject洩漏主模態zh_TW
dc.subjectLeaky waveen_US
dc.subjectCoupled linesen_US
dc.subjectSpectral domain approachen_US
dc.subjectLeaky dominant modeen_US
dc.title多重耦合微帶線上的洩漏主模態之分析及測量zh_TW
dc.titleAnalysis and measurement of leaky dominant modes on multiple coupled microstripsen_US
dc.typeThesisen_US
dc.contributor.department電信工程研究所zh_TW
Appears in Collections:Thesis