產出績效衡量指標之研究

Abstract

晶圓代工業已成為臺灣半導體業的製造主流，而晶圓代工業的特點就是產品多樣少量，產品組合多變。由於多變的產品組合，導致不少管理上的困難，其中之一就是產出績效產衡量，產量容易因產品組合的影響而有相當大的變異，無法有效且公平地衡量出績效的優劣。過去Leachman等學者曾提出衡量產出的公式，即以光罩層數為單位來衡量產出，但其公式並不完全適用於任何半導體廠，還有改進的空間。 本研究考慮不同產品組合下廠內所有的工作站的負荷情形，從中分析與設計出新的指標，並找出指標與產出的關係式，以作為產品組合與產出之間的轉換機制，藉以有效且合理地衡量產出績效。

Wafer foundries have become the mainstream of semiconductor industry in Taiwan and one characteristic of foundries is that it produce many in kind but few in volume, and its product mix changes frequently.The frequent change of product mix causes many management difficulties, one of these is the performance evaluation on throughput. There is a great variation in wafer out because of product mix, so the index wafer out cannot fairly and effectively measure the performance on throughput. Leachman published his throughtput evaluation formula that evaluated throughput performance based on mask layers, but the formula was not applicable for all semiconductor companies, and was not well justified. The study first considers the loading situation of all workstations in different product mix. Based on the loading situation, we analyze and design new performance index, then find the relation formula between the index and the throughput, finally use the formula to be the conversion mechanism between product mix and throughput ot fairly and reasonably evaluate the throughput performace.