完整後設資料紀錄
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dc.contributor.author余泰成en_US
dc.contributor.author張振雄en_US
dc.date.accessioned2014-12-12T02:19:20Z-
dc.date.available2014-12-12T02:19:20Z-
dc.date.issued1997en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT863124014en_US
dc.identifier.urihttp://hdl.handle.net/11536/63353-
dc.description.abstract本研究是以垂直布氏長晶法來成長AgGaS2 AgGa(S1-xSex)2這幾顆晶體並對晶體來做其電性及物性分析EPMA Raman X-ray PL FTIR DTA 來分析AgGaS2 AgGa(S1-xSex)2 這些紅外線非線性晶體。晶體成長的過程中,藉著長晶的速率改變,來克服晶體的脆裂。並且在這些四元成分生長的晶體中,我們得到其能隙變化有線性關係,及在C、A軸有線性關係。AgGaS2 、AgGaSe2、AgGa(S0.1Se.9)2晶體在紅外光譜中通光範圍分別為0.48-14um、及0.705-19.45um、0.679-19.275um。AgGa(S0.1Se.9)2在拉曼光譜原子在晶體中振動模式類似AgGaSe2。zh_TW
dc.description.abstractIn this study, AgGaS2 AgGaSe2 and AgGa(S0.1Se.9)2 single crystal were growth by Vertical Bridgman method. By changing the growth rate,we can decreased the crack occured in the crystals. Using X-ray PL,FTIR,DTA Raman spectrum, EPMA these measurements, we find these crystals' electrical and optical properties. The linear relationship was found between the bandgap and lattice constant of axis a and c within these crystals. From FTIR meansurement, we obtain transmission range of these crystals AgGaS2 AgGaSe2 and AgGa(S0.1Se.0.9)2:0.48-14um 0.705-19.45um 0.679-19.275u m respectively. As for Raman shift, cruystal of AgGa(S0.1Se0.9)2 shows the result simlar to those of the AgGaSe2 .en_US
dc.language.isozh_TWen_US
dc.subject方向性zh_TW
dc.subject單晶zh_TW
dc.title具方向性晶種成長AgGaS2 AgGa2 和 AgGa(S0.1Se0.9)2單晶zh_TW
dc.titleGrowth Single Crystal AgGaS2, AgGaSe2 And AgGa(S0.1Se0.9)2 With Oriented Directional Seeden_US
dc.typeThesisen_US
dc.contributor.department光電工程學系zh_TW
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