標題: Fault dictionary size reduction for million-gate large circuits
作者: Hong, Yu-Ru
Huang, Juinn-Dar
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 2007
摘要: In general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.
URI: http://hdl.handle.net/11536/6501
ISBN: 978-1-4244-0629-6
期刊: PROCEEDINGS OF THE ASP-DAC 2007
起始頁: 829
結束頁: 834
顯示於類別:會議論文