Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 徐舜威 | en_US |
dc.contributor.author | Shang-wei Shi | en_US |
dc.contributor.author | 趙于飛 | en_US |
dc.contributor.author | Y. F. Chao | en_US |
dc.date.accessioned | 2014-12-12T02:22:01Z | - |
dc.date.available | 2014-12-12T02:22:01Z | - |
dc.date.issued | 1998 | en_US |
dc.identifier.uri | http://140.113.39.130/cdrfb3/record/nctu/#NT870614040 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/65058 | - |
dc.description.abstract | 使用光彈調變橢圓偏光儀來量測楔角為本論文主要的目的,一般我們是藉由橢圓儀來量測材料的橢圓參數φ及Δ,進而推算材料的光學參數如:折射率、消光係數及薄膜厚度。 楔鏡一般在光學系統中是用來作光束調整的功用,實驗則對其作小角度的量測。實驗首先作系統角度的校準,以確定各元件相對角度關係,之後量測楔鏡的橢圓參數 φ 值,其產生有兩道光束,我們藉由第一道反射光的橢圓參數值推算得入射光的入射角值,並藉由第二道反射光的橢圓參數值推算楔鏡的斜角值。 | zh_TW |
dc.description.abstract | Use Photoelastic ellipsometry to measure the angle of a wedge is the main purpose of this thesis. The ellipsometric parameters, φ and Δmeasured in the ellipsometry are used to extract the optical parameters. After correcting the relative angle of polarizer (P), photoelastic modulator (PEM), analyzer in a straight through setup, we insert a wedge (S) forming a reflecting setup, which is called as PPEMSA system. The zero point, the reflecting surface of the system, is determined before measuring the ellipsometric parameter. The ellipsometric parameter φ of two reflected beams are measured, the first beam is used to measure the incident angle and the second is used to measure the angle of the wedge. | en_US |
dc.language.iso | zh_TW | en_US |
dc.subject | 偏光 | zh_TW |
dc.subject | 光彈調變器 | zh_TW |
dc.subject | 橢圓儀 | zh_TW |
dc.subject | 楔鏡 | zh_TW |
dc.subject | polarized light | en_US |
dc.subject | photoelasticity | en_US |
dc.subject | ellipsometry | en_US |
dc.subject | wedge | en_US |
dc.title | 利用光彈調制橢圓偏光儀量測楔角 | zh_TW |
dc.title | Photoelastic ellipsometry and its measurement on the angle of wedge | en_US |
dc.type | Thesis | en_US |
dc.contributor.department | 光電工程學系 | zh_TW |
Appears in Collections: | Thesis |