完整後設資料紀錄
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dc.contributor.author徐舜威en_US
dc.contributor.authorShang-wei Shien_US
dc.contributor.author趙于飛en_US
dc.contributor.authorY. F. Chaoen_US
dc.date.accessioned2014-12-12T02:22:01Z-
dc.date.available2014-12-12T02:22:01Z-
dc.date.issued1998en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#NT870614040en_US
dc.identifier.urihttp://hdl.handle.net/11536/65058-
dc.description.abstract使用光彈調變橢圓偏光儀來量測楔角為本論文主要的目的,一般我們是藉由橢圓儀來量測材料的橢圓參數φ及Δ,進而推算材料的光學參數如:折射率、消光係數及薄膜厚度。 楔鏡一般在光學系統中是用來作光束調整的功用,實驗則對其作小角度的量測。實驗首先作系統角度的校準,以確定各元件相對角度關係,之後量測楔鏡的橢圓參數 φ 值,其產生有兩道光束,我們藉由第一道反射光的橢圓參數值推算得入射光的入射角值,並藉由第二道反射光的橢圓參數值推算楔鏡的斜角值。zh_TW
dc.description.abstractUse Photoelastic ellipsometry to measure the angle of a wedge is the main purpose of this thesis. The ellipsometric parameters, φ and Δmeasured in the ellipsometry are used to extract the optical parameters. After correcting the relative angle of polarizer (P), photoelastic modulator (PEM), analyzer in a straight through setup, we insert a wedge (S) forming a reflecting setup, which is called as PPEMSA system. The zero point, the reflecting surface of the system, is determined before measuring the ellipsometric parameter. The ellipsometric parameter φ of two reflected beams are measured, the first beam is used to measure the incident angle and the second is used to measure the angle of the wedge.en_US
dc.language.isozh_TWen_US
dc.subject偏光zh_TW
dc.subject光彈調變器zh_TW
dc.subject橢圓儀zh_TW
dc.subject楔鏡zh_TW
dc.subjectpolarized lighten_US
dc.subjectphotoelasticityen_US
dc.subjectellipsometryen_US
dc.subjectwedgeen_US
dc.title利用光彈調制橢圓偏光儀量測楔角zh_TW
dc.titlePhotoelastic ellipsometry and its measurement on the angle of wedgeen_US
dc.typeThesisen_US
dc.contributor.department光電工程學系zh_TW
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