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| Investigation of Channel Backscattering Characteristics in Nanoscale Uniaxial-Strained PMOSFETs | 102 |
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| Investigation of Channel Backscattering Characteristics in Nanoscale Uniaxial-Strained PMOSFETs | 102 |
| 檢視 | |
|---|---|
| 000272047300005.pdf | 8 |
| 檢視 | |
|---|---|
| 中國 | 95 |
| 美國 | 7 |
| 檢視 | |
|---|---|
| Shenzhen | 93 |
| Menlo Park | 4 |
| Beijing | 2 |
| Kensington | 2 |
| Edmond | 1 |