標題: | Thickness Dependent Phase Behavior of Antiferroelectric Liquid Crystal Films |
作者: | Pan, LiDong Wang, Shun Hsu, C. S. Huang, C. C. 應用化學系 Department of Applied Chemistry |
公開日期: | 30-十月-2009 |
摘要: | Free standing films of a liquid crystal compound with simple surface enhanced order were studied. The resultant phase diagram demonstrates that (1) the short helical pitch smectic-C-alpha* phase disappears below a film thickness of 10 layers, and (2) the temperature window of a distorted 4 layer smectic-C-FI2* phase increases dramatically upon decreasing film thickness. The experimental findings were attributed to the reduced dimensionality and enhanced surface effects in thin films. The results of the smectic-C-alpha* phase are consistent with what have been reported for helically ordered magnetic thin films, with a noticeable difference due to the opposite effect of the surface on ordering in the two systems. |
URI: | http://dx.doi.org/10.1103/PhysRevLett.103.187802 http://hdl.handle.net/11536/6548 |
ISSN: | 0031-9007 |
DOI: | 10.1103/PhysRevLett.103.187802 |
期刊: | PHYSICAL REVIEW LETTERS |
Volume: | 103 |
Issue: | 18 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 期刊論文 |