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dc.contributor.authorHuang, C. W.en_US
dc.contributor.authorChen, Langen_US
dc.contributor.authorWang, J.en_US
dc.contributor.authorHe, Q.en_US
dc.contributor.authorYang, S. Y.en_US
dc.contributor.authorChu, Y. H.en_US
dc.contributor.authorRamesh, R.en_US
dc.date.accessioned2014-12-08T15:08:33Z-
dc.date.available2014-12-08T15:08:33Z-
dc.date.issued2009-10-01en_US
dc.identifier.issn1098-0121en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.80.140101en_US
dc.identifier.urihttp://hdl.handle.net/11536/6580-
dc.description.abstractThe experimental domain size scaling law in epitaxial BiFeO(3) films shows a different behavior from predictions of the conventional elastic domains: the (101)-type 71 degrees domains are much wider than that of (100)-type 109 degrees despite the larger domain-wall energy in (100) boundary. A phenomenological analysis for rhombohedral BiFeO(3) film is proposed, and it reveals that both the depolarizing energy and the elastic energy are indispensable for the equilibrium domain structures. With the increase in the asymmetrical electrostatic boundary on the film surfaces, the dominant domain scaling mechanism changes from electrostatic-dependent domain structure to elastic-dependent one, which is consistent with the experimental data. The present results highlight the general role of depolarizing field in rhombohedral domain structures.en_US
dc.language.isoen_USen_US
dc.titlePhenomenological analysis of domain width in rhombohedral BiFeO(3) filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.80.140101en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume80en_US
dc.citation.issue14en_US
dc.citation.spageen_US
dc.citation.epageen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
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