標題: | DNA Mismatch Detection by Metal Ion Enhanced Impedance Analysis |
作者: | Jangjian, Peng-Chung Liu, Tzeng-Feng Tsai, Chuan-Mei Li, Mei-Yi Tsai, Ming-Shih Tseng, Shin-Hua Cheng, Tsai-Mu Chang, Chia-Ching 材料科學與工程學系 生物科技學系 Department of Materials Science and Engineering Department of Biological Science and Technology |
公開日期: | 1-十月-2009 |
摘要: | Conventional diagnoses of genetic mutation and disease depend on the analysis of DNA sequences. However, mismatches in the DNA sequences are difficult to detect using traditional sequencing. Doping metal ions, such as nickel, into the short DNA (28 mer similar to 30 mer), markedly reduces its electrical resistance, which is measured by electrical impedance analysis. The change in resistance that is caused by a mismatched base-pair in short DNA can also be monitored by this approach. In this study, the resistance increased exponentially with the number of mismatched base-pairs. Accordingly, an intuitive and direct method for evaluating the number of DNA mismatches can possibly be developed. |
URI: | http://hdl.handle.net/11536/6600 |
ISSN: | 0577-9073 |
期刊: | CHINESE JOURNAL OF PHYSICS |
Volume: | 47 |
Issue: | 5 |
起始頁: | 740 |
結束頁: | 747 |
顯示於類別: | 期刊論文 |