完整後設資料紀錄
DC 欄位語言
dc.contributor.authorLuo, C. W.en_US
dc.contributor.authorWang, Y. T.en_US
dc.contributor.authorChen, F. W.en_US
dc.contributor.authorShih, H. C.en_US
dc.contributor.authorKobayashi, T.en_US
dc.date.accessioned2014-12-08T15:09:09Z-
dc.date.available2014-12-08T15:09:09Z-
dc.date.issued2009-07-06en_US
dc.identifier.issn1094-4087en_US
dc.identifier.urihttp://dx.doi.org/10.1364/OE.17.011321en_US
dc.identifier.urihttp://hdl.handle.net/11536/6981-
dc.description.abstractThe coherence spike of femtosecond laser pulses in the reflection-type pump-probe measurements has been systematically studied in the semiconductor (100) InP. By varying the setup of the pump-probe measuring system, i.e. the polarizations of pump and probe pulses, the incident angles of pump and probe beams, and the interval of delay time between pump and probe pulses, the dramatic changes in the strength of coherence spike could be clear observed. Furthermore, the proposed methods to remove the coherence spike from the transient reflectivity curves have been demonstrated in the time-domain measurements. (C) 2009 Optical Society of Americaen_US
dc.language.isoen_USen_US
dc.titleEliminate coherence spike in reflection-type pump-probe measurementsen_US
dc.typeArticleen_US
dc.identifier.doi10.1364/OE.17.011321en_US
dc.identifier.journalOPTICS EXPRESSen_US
dc.citation.volume17en_US
dc.citation.issue14en_US
dc.citation.spage11321en_US
dc.citation.epage11327en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000267761200011-
dc.citation.woscount6-
顯示於類別:期刊論文


文件中的檔案:

  1. 000267761200011.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。