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dc.contributor.authorLiu, Wei-Chengen_US
dc.contributor.authorWang, Li-Chunen_US
dc.date.accessioned2014-12-08T15:09:14Z-
dc.date.available2014-12-08T15:09:14Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-0352-3en_US
dc.identifier.issn1550-3607en_US
dc.identifier.urihttp://hdl.handle.net/11536/7046-
dc.identifier.urihttp://dx.doi.org/10.1109/ICC.2007.706en_US
dc.description.abstractIn this paper, we present an analytical method to evaluate the bit error rate (BER) of the ultra-wideband (UWB) system in the IEEE 802.15.4a standardized channel model. The IEEE 802.15.4a UWB channel model is more general and based on more measurements than the earlier IEEE 802.15.3a model. It also poses new challenge in analyzing UWB performance in such a channel. First, the power delay profile become a function of randomly arriving cluster and ray arrival time. Second, the signal amplitude in the IEEE 802.15.4a channel is modeled by a Nakagami random variable of which the Nakagami fading parameter is log-normally distributed. Thus, the signal amplitude is a nonlinear function of a log-normally distributed random variable. By means of counting integral of Lebesgue measure theory, the analytical expression for the BER performance in the IEEE 802.15.4a UWB channel is presented. We apply this analytical model to investigate the impacts of various UWB channel parameters on the system performance and provide some useful insights into the design of UWB transceiver.en_US
dc.language.isoen_USen_US
dc.subjectultra-wideband (UWB)en_US
dc.subjectIEEE 802.15.4a channel modelen_US
dc.subjectbit error rate (BER)en_US
dc.titleBER analysis in a generalized UWB frequency selective fading channel with randomly arriving clusters and raysen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/ICC.2007.706en_US
dc.identifier.journal2007 IEEE INTERNATIONAL CONFERENCE ON COMMUNICATIONS, VOLS 1-14en_US
dc.citation.spage4281en_US
dc.citation.epage4286en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000257882503001-
Appears in Collections:Conferences Paper


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