完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Lin, C. H. | en_US |
dc.contributor.author | Lin, H. S. | en_US |
dc.contributor.author | Huang, C. C. | en_US |
dc.contributor.author | Su, S. K. | en_US |
dc.contributor.author | Lin, S. D. | en_US |
dc.contributor.author | Sun, K. W. | en_US |
dc.contributor.author | Lee, C. P. | en_US |
dc.contributor.author | Liu, Y. K. | en_US |
dc.contributor.author | Yang, M. D. | en_US |
dc.contributor.author | Shen, J. L. | en_US |
dc.date.accessioned | 2014-12-08T15:09:30Z | - |
dc.date.available | 2014-12-08T15:09:30Z | - |
dc.date.issued | 2009-05-04 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.3130741 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/7248 | - |
dc.description.abstract | We present detailed experimental results of the temperature dependence of continuous wave and time-resolved photoluminescence (PL) spectroscopy in self-assembled InAs/GaAs quantum dot and quantum ring nanostructures. A dramatic increase in PL decay time of the excited and ground states is observed in InAs quantum rings at high temperature. We speculate that the longer PL lifetime in quantum rings is due to the interplay among the dark states, ground states, and the reduced wave function overlapping between electrons and holes. A rate equation model is proposed to interpret the observed temperature dependence of the ground state exciton lifetime. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | dark states | en_US |
dc.subject | excitons | en_US |
dc.subject | gallium arsenide | en_US |
dc.subject | III-V semiconductors | en_US |
dc.subject | indium compounds | en_US |
dc.subject | photoluminescence | en_US |
dc.subject | self-assembly | en_US |
dc.subject | semiconductor quantum dots | en_US |
dc.subject | time resolved spectra | en_US |
dc.title | Temperature dependence of time-resolved photoluminescence spectroscopy in InAs/GaAs quantum ring | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.3130741 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 94 | en_US |
dc.citation.issue | 18 | en_US |
dc.citation.epage | en_US | |
dc.contributor.department | 應用化學系 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Applied Chemistry | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000265933700045 | - |
dc.citation.woscount | 11 | - |
顯示於類別: | 期刊論文 |