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dc.contributor.authorLin, C. H.en_US
dc.contributor.authorLin, H. S.en_US
dc.contributor.authorHuang, C. C.en_US
dc.contributor.authorSu, S. K.en_US
dc.contributor.authorLin, S. D.en_US
dc.contributor.authorSun, K. W.en_US
dc.contributor.authorLee, C. P.en_US
dc.contributor.authorLiu, Y. K.en_US
dc.contributor.authorYang, M. D.en_US
dc.contributor.authorShen, J. L.en_US
dc.date.accessioned2014-12-08T15:09:30Z-
dc.date.available2014-12-08T15:09:30Z-
dc.date.issued2009-05-04en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3130741en_US
dc.identifier.urihttp://hdl.handle.net/11536/7248-
dc.description.abstractWe present detailed experimental results of the temperature dependence of continuous wave and time-resolved photoluminescence (PL) spectroscopy in self-assembled InAs/GaAs quantum dot and quantum ring nanostructures. A dramatic increase in PL decay time of the excited and ground states is observed in InAs quantum rings at high temperature. We speculate that the longer PL lifetime in quantum rings is due to the interplay among the dark states, ground states, and the reduced wave function overlapping between electrons and holes. A rate equation model is proposed to interpret the observed temperature dependence of the ground state exciton lifetime.en_US
dc.language.isoen_USen_US
dc.subjectdark statesen_US
dc.subjectexcitonsen_US
dc.subjectgallium arsenideen_US
dc.subjectIII-V semiconductorsen_US
dc.subjectindium compoundsen_US
dc.subjectphotoluminescenceen_US
dc.subjectself-assemblyen_US
dc.subjectsemiconductor quantum dotsen_US
dc.subjecttime resolved spectraen_US
dc.titleTemperature dependence of time-resolved photoluminescence spectroscopy in InAs/GaAs quantum ringen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.3130741en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume94en_US
dc.citation.issue18en_US
dc.citation.epageen_US
dc.contributor.department應用化學系zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000265933700045-
dc.citation.woscount11-
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