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dc.contributor.authorChin, Wen-Longen_US
dc.contributor.authorChen, Sau-Geeen_US
dc.date.accessioned2014-12-08T15:09:30Z-
dc.date.available2014-12-08T15:09:30Z-
dc.date.issued2009-05-01en_US
dc.identifier.issn0916-8516en_US
dc.identifier.urihttp://dx.doi.org/10.1587/transcom.E92.B.1828en_US
dc.identifier.urihttp://hdl.handle.net/11536/7249-
dc.description.abstractConventional symbol time (ST) synchronization algorithms for orthogonal frequency-division multiplexing (OFDM) systems are mostly based on the maximum correlation result of the cyclic prefix. Due to the channel effect, the estimated ST is not accurate enough. Hence, one needs to further identify the channel impulse response (CIR) so as to obtain a better ST estimation. Overall, the required computational complexity is high because it involves time-domain (TD) correlation operations, as well as the fast Fourier transform (FFF) and inverse FFT (IFFT) operations. In this work. without the FFT/IFFT operations and the knowledge of CIR, a low-complexity TD ST estimation is proposed. We first characterize the frequency-domain (FD) interference effect. Based on the derivation, the new method locates the symbol boundary at the sampling point with the minimum interference in the FD (instead of the conventional maximum TD correlation result). Moreover. to reduce the computational complexity, the proposed FD minimum-interference (MI) metric is converted to a low-complexity TD metric by utilizing Parseval's theorem and the sampling theory. Simulation results exhibit good performance for the proposed algorithm in multipath fading channels.en_US
dc.language.isoen_USen_US
dc.subjectOFDMen_US
dc.subjectsymbol time estimationen_US
dc.titleA Low-Complexity Minimum-Interference Symbol Time Estimation for OFDM Systemsen_US
dc.typeArticleen_US
dc.identifier.doi10.1587/transcom.E92.B.1828en_US
dc.identifier.journalIEICE TRANSACTIONS ON COMMUNICATIONSen_US
dc.citation.volumeE92Ben_US
dc.citation.issue5en_US
dc.citation.spage1828en_US
dc.citation.epage1833en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000266425400047-
dc.citation.woscount3-
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