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dc.contributor.authorKuo, Jen-Tsaien_US
dc.contributor.authorChiou, Yi-Chyunen_US
dc.contributor.authorWu, Juo-Shiuanen_US
dc.date.accessioned2014-12-08T15:09:45Z-
dc.date.available2014-12-08T15:09:45Z-
dc.date.issued2007en_US
dc.identifier.isbn978-1-4244-0687-6en_US
dc.identifier.issn0149-645Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/7457-
dc.identifier.urihttp://dx.doi.org/10.1109/MWSYM.2007.380317en_US
dc.description.abstractMiniaturization of microstrip rat race coupler is implemented by incorporating a broadside-coupled structure and stepped-impedance line sections into the design. The former is used to replace the 3 lambda/4-section and the latter is to substitute the lambda/4-line in the conventional circuit. No lumped-element is required in the circuit. One of the experimental circuits occupies only 18.3% of the area of a traditional 6 lambda/4-rat race. It is believed that it has the best size reduction in comparison with those in open literature. In addition to a wideband characteristic, total inband power loss is better than 3.2%. Measurement results are shown to validate the design and theoretical prediction.en_US
dc.language.isoen_USen_US
dc.subject3-dB coupleren_US
dc.subjectbroadside-coupleden_US
dc.subjectminiaturizationen_US
dc.subjectrat raceen_US
dc.subjectwidebanden_US
dc.titleMiniaturized rat race coupler with microstrip-to-CPW broadside-coupled structure and stepped-impedance sectionsen_US
dc.typeProceedings Paperen_US
dc.identifier.doi10.1109/MWSYM.2007.380317en_US
dc.identifier.journal2007 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-6en_US
dc.citation.spage169en_US
dc.citation.epage172en_US
dc.contributor.department電信工程研究所zh_TW
dc.contributor.departmentInstitute of Communications Engineeringen_US
dc.identifier.wosnumberWOS:000250827400039-
Appears in Collections:Conferences Paper


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