放大鏡及燈光對目檢績效之影響

Abstract

半導體產業的最終品質非常仰賴外觀目檢，然而IC尺寸越來越輕薄，再加上環境保護的要求，對於外觀目檢品質形成更多挑戰。本篇研究目的在找出放大鏡及工作桌桌燈對於目檢績效的影響，以期降低C工廠的客戶批退率。本研究針對兩個因子使用全因子集區實驗，並用統計方法分析實驗結果。分析顯示放大鏡及燈光是顯著因子。

In semiconductor industry, visual inspection was heavily relied on for its final quality. However, thinner and smaller size of IC parts and rising concerns over environmental protection has placed more challenges to visual quality. This study aims to find out the effects of the magnifier and the desk lamp on visual inspection performance in an effort to reduce customers’ rejection rate at the Factory C. The experiment was conducted using full factorial design with 2 factors in blocks. The statistical analysis was followed to interpret the results of the experiment, suggesting that the magnifier and the lamp were significant factors.