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dc.contributor.authorWu, K. H.en_US
dc.contributor.authorHsu, T. Y.en_US
dc.contributor.authorShih, H. C.en_US
dc.contributor.authorChen, Y. J.en_US
dc.contributor.authorLuo, C. W.en_US
dc.contributor.authorUen, T. M.en_US
dc.contributor.authorLin, J. -Y.en_US
dc.contributor.authorJuang, J. Y.en_US
dc.contributor.authorKobayashi, T.en_US
dc.date.accessioned2014-12-08T15:10:00Z-
dc.date.available2014-12-08T15:10:00Z-
dc.date.issued2009-02-15en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.3078082en_US
dc.identifier.urihttp://hdl.handle.net/11536/7630-
dc.description.abstractIn this work, we use ultrafast optical pump-optical probe spectroscopy to probe the polaron dynamics in La(0.7)Ca(0.3)MnO(3) (LCMO) thin films. The temporal evolution in transient reflectivity change Delta R/R exhibits two relaxing components: a fast component with a time constant of subpicosecond and a slow component with time constant ranging from tens of picoseconds to hundreds of picoseconds. The amplitude of the fast component, though has been seldom discussed before, exhibits the similar temperature dependence with that of the resistivity and the neutron scattering intensity due to nanoscale correlated polarons. The results strongly suggest that the fast photoinduced reflectivity change may have been due to the photoexcitation and trapping process of correlated Jahn-Teller polarons in the paramagnetic and ferromagnetic phases and, thus, implies the presence of electronic inhomogeneity in LCMO manganites.en_US
dc.language.isoen_USen_US
dc.titleUltrafast optical probes of polaron dynamics in La(0.7)Ca(0.3)MnO(3) thin filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.3078082en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume105en_US
dc.citation.issue4en_US
dc.citation.spageen_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentInstitute of Physicsen_US
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