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dc.contributor.authorMai, Hung-Chuanen_US
dc.contributor.authorHsieh, Tsung-Eongen_US
dc.contributor.authorJeng, Shiang-Yaoen_US
dc.contributor.authorChen, Chong-Mingen_US
dc.contributor.authorWang, Jen-Longen_US
dc.date.accessioned2014-12-08T15:10:00Z-
dc.date.available2014-12-08T15:10:00Z-
dc.date.issued2009-02-15en_US
dc.identifier.issn0254-0584en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.matchemphys.2008.08.039en_US
dc.identifier.urihttp://hdl.handle.net/11536/7631-
dc.description.abstractOptimum structure for HD-DVD optical disks containing Al-Ti/Si bi-layer recording system was identified by reflectivity simulation and dynamic test of disk samples. For the disk sample with optimized structure, the maximum partial response signal-to-noise ratio (PRSNR) of 19.1 dB, minimum simulated bit error rate (sbER) of 1.7 X 10(-7) and modulation >0.6 were achieved at the writing power (P(W)) = 11.2 mW. Transmission electron microscopy (TEM) revealed that the polycrystalline granular clusters constitute the recording marks. Subsequent analyses evidenced that element mixing/alloy reactions occur in between Si and Al-Ti layers and the formation of Al(3.21)Si(0.47) crystalline phase is responsible for the signal recording in the disk samples. (C) 2008 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectWrite-once optical disken_US
dc.subjectBi-layer recording structureen_US
dc.subjectSignal propertiesen_US
dc.subjectMicrostructureen_US
dc.titleStudy of Al-Ti/Si bi-layer as the recording media for write-once HD-DVD optical disksen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.matchemphys.2008.08.039en_US
dc.identifier.journalMATERIALS CHEMISTRY AND PHYSICSen_US
dc.citation.volume113en_US
dc.citation.issue2-3en_US
dc.citation.spage680en_US
dc.citation.epage684en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000263249500035-
dc.citation.woscount0-
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