标题: 以飞秒光谱研究拓朴绝缘体单晶与薄膜之超快动力学
Ultrafast Dynamics in Topological Insulator Single Crystals and Thin Films Resolved by Femtosecond Spectroscopy
作者: 陈学儒
Chen, Hsueh-Ju
吴光雄
Wu, Kaung Hsiung
电子物理系所
关键字: 拓朴绝缘体;时间解析光谱;超快动力学;脉冲雷射沉积法;Topological insualtors;Time resolved spectroscopy;Ultrafast dynamics;Pulsed laser deposition
公开日期: 2014
摘要: 本论文中,我们利用飞秒光谱探讨拓朴绝缘体单晶及薄膜中载子带间跃迁与带内跃迁之动力学行为。其动力学特性将藉由可见光激发-可见光探测光谱、兆赫波时析光谱,以及可见光激发-中红外光探测光谱进行研究。当中,温度相依之能带空缺效应与载子密度相依之表面态散射率抑制效应与时析角分辨光电子能谱具有良好之一致性。
首先,我们以脉冲雷射蒸镀法制备磊晶碲化铋薄膜与c轴掺铜碲硒化铋薄膜。薄膜与单晶样品之结构特性皆使用X光绕射谱以及拉曼光谱进行检验。其化学元素组成透过能量散失光谱进行确认。样品之载子极性与浓度以标准霍尔量测方法取得。
通过量测掺杂与未掺杂之硒化铋单晶,我们确认在短延迟时间内之瞬时反射率主要由能带填充效应以及自由载子吸收效应贡献,此两者贡献可藉由瞬时反射率变化之正负号判定。同调光频声子与同调声频声子的贡献可藉由特征行为的时间尺度进行区分。在时间尺度约十皮秒左右之慢迟缓行为可归因于载子扩散行为所导致。上述能带填充效应之弛缓行为可归因至能带空缺效应。利用双温模型,我们由能带填充效应之弛缓行为得到温度相依电子声子耦合常数。电子声子耦合常数随温度减弱的行为抑制了表面态与块材态导带间的散射行为。
磊晶碲化铋薄膜中之温度相依载子传输特性以及电子-声子耦合作用可藉由温度可调兆赫波时析光谱进行研究。其中,杂质能阶会因热激发效应产生额外载子,使自由载子浓度增加。在温度为200 K以下时,载子散射机制主要由电子-电子散射主导。薄膜兆赫光谱之居德权重展现了脉冲雷射沉积薄膜具备应用潜力。由于Fano效应所致,红外声子模态出现异常的红移行为。其中,声子能量的重整效应可归因于电子-红外声子交互作用。
透过时间解析红外光反射频谱,我们对光激载子的带内跃迁动力学行为进行探讨。其中,居德权重的增加说明了导带中电子占据率的增加。藉由载子密度相依实验,我们观察到能隙重整效应与热声子效应。表面态的金属性响应行为因导带电子的注入而受到抑制,导带内高能量电子的散射率抑制行为也表现在时间解析红外光反射频谱中。同时,我们观察到掺铜碲硒化铋薄膜之低频实部电导变化率出现低谷特征。最后,我们提出迪拉克电子之电磁响应可利用光激发-中红外光谱来研究。
In this dissertation, the interband and intraband carrier dynamics of the topological insulators (TI) single crystals and thin films are investigated by the femtosecond spectroscopy. The dynamic characteristics of the carrier relaxation process have been investigated by the degenerate pump-probe spectroscopy (OPOP), terahertz time-domain spectroscopy (THz-TDS), and optical pump-mid-infrared probe spectroscopy (OPMP). The temperature dependent band emptying effect and the density of state dependent suppression in surface state scattering are in good agreement with the results revealed in time- and angular-resolved photoemssion spectroscopy (trARPES).
Epitaxial Bi2Te¬3 thin films and c-axis Cu0.1Bi2Te1.2Se1.43 (CBTS) thin films were fabricated by pulsed laser deposition (PLD). The structural characteristics of the TI crystals and films were examined by the X-ray diffraction spectroscopy and Raman spectroscopy. The chemical composition of all samples have been investigated by the Energy-dispersive X-ray spectroscopy (EDX). The carrier polarity and concentration are determined by standard Hall measurement.
In the short timescale, the transient reflectivity change (∆R⁄R) obtained from the doped Bi2Se3 crystals shows that the band filling effect (BF) and the free carrier absorption (FCA) effect can be distinguished by the sign of the ∆R⁄R signal. The coherent longitudinal optical and acoustic phonon can be observed in the different timescale. The temperature dependent diffusion coefficient can be determined by the characteristic time of the slow decay at 10 ps timescale. The relaxation of the FCA effect can refer to the band-emptying (BE) effect. By the two temperature model, the temperature dependent electron-phonon coupling constant is determined. The suppression of the inelastic scattering of bulk conducting electrons can attribute to the decrease of the electron-phonon coupling constant.
The temperature dependent THz-TDS revealed the carrier transport properties the electron-phonon coupling in the epitaxial Bi2Te3 film. The thermal excitation of carriers from the impurity band led to the increase of carrier density. The carrier scattering is dominated by electron-electron scattering when temperature below 200 K. The Drude weight of the film shows the application potential of PLD films. Further, the anomalous redshift of the IR phonon is attribute to the Fano effect. The renormalization of the phonon energy is attributed to the electron–IR phonon interaction.
The temporally and spectrally resolved Mid-IR reflectivity reveals the intraband dynamics of photoecited carriers. The positive change of Drude weight indicates the photoinduced excess population in the conduction band. The band gap renormalization and the hot phonon effect are observed via the density dependent experiment. The reduction of the metallic surface state response is quenched by the injection of the bulk conducting carriers. The reduction of the scattering rate of the bulk conducting electrons has been observed. The low frequency dip of ΔG_1 has been observed in CBTS thin film. We conclude that the response of the Dirac electrons can be observed by the optical pump-mid-infrared probe spectroscopy.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT079721531
http://hdl.handle.net/11536/76413
显示于类别:Thesis