氧化侷限面射型雷射中的空間燒洞現象與模態競爭

Abstract

電流擴散及載子的散佈(spreading)效應與空間燒洞（spatial hole burning）現象會影響雷射元件的工作效能。為探討其產生影響的機制，本論文推導獲得空間座標無關的載子、光子的時變率方程組，並以數值方法及利用求解非線性方程組的牛頓法來求得各種條件的穩態解，而據以分析討論氧化侷限型面射型雷射的發光模態(mode)。本論文就圓盤狀電極結構模擬分析面射型雷射的發光模態，所得結果可完美地解釋空間燒洞現象及其對模態消長的影響。另外，本論文亦分析了電流侷限程度與載子散佈(spreading)程度對氧化侷限面射型雷射的臨界電流、發光強度與模態競爭關係的影響。

The carrier diffusion, current spreading and spatial hole burning can cause a severe impact on VCSEL performance. To investigate these effects, the system of spatially independent carrier and photon rate equations is derived to examine the correlation between current density and mode distribution. A set of solutions for steady state is solved by the Newton’s method for nonlinear systems of equations under different initial conditions. The mode concept of oxide-confined VCSELs is also systematically studied. The disk-like contact is used throughout the calculations. The spatial hole burning effect related with the mode competition can be reasonable explained in our simulation. The influence of current spreading and carrier diffusion on the threshold current, optical power and mode competition of oxide-confined VCSELs is also investigated and analyzed.