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dc.contributor.author莊明曉en_US
dc.contributor.authorMing-Hsiao Chuangen_US
dc.contributor.author楊賜麟en_US
dc.contributor.authorDr. Su-Lin Yangen_US
dc.date.accessioned2014-12-12T02:56:12Z-
dc.date.available2014-12-12T02:56:12Z-
dc.date.issued2005en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009321531en_US
dc.identifier.urihttp://hdl.handle.net/11536/78973-
dc.description.abstract電流擴散及載子的散佈(spreading)效應與空間燒洞(spatial hole burning)現象會影響雷射元件的工作效能。為探討其產生影響的機制,本論文推導獲得空間座標無關的載子、光子的時變率方程組,並以數值方法及利用求解非線性方程組的牛頓法來求得各種條件的穩態解,而據以分析討論氧化侷限型面射型雷射的發光模態(mode)。本論文就圓盤狀電極結構模擬分析面射型雷射的發光模態,所得結果可完美地解釋空間燒洞現象及其對模態消長的影響。另外,本論文亦分析了電流侷限程度與載子散佈(spreading)程度對氧化侷限面射型雷射的臨界電流、發光強度與模態競爭關係的影響。zh_TW
dc.description.abstractThe carrier diffusion, current spreading and spatial hole burning can cause a severe impact on VCSEL performance. To investigate these effects, the system of spatially independent carrier and photon rate equations is derived to examine the correlation between current density and mode distribution. A set of solutions for steady state is solved by the Newton’s method for nonlinear systems of equations under different initial conditions. The mode concept of oxide-confined VCSELs is also systematically studied. The disk-like contact is used throughout the calculations. The spatial hole burning effect related with the mode competition can be reasonable explained in our simulation. The influence of current spreading and carrier diffusion on the threshold current, optical power and mode competition of oxide-confined VCSELs is also investigated and analyzed.en_US
dc.language.isozh_TWen_US
dc.subject空間燒洞zh_TW
dc.subject垂直共振腔面射型雷射zh_TW
dc.subjectspatial hole burningen_US
dc.subjectVCSELen_US
dc.title氧化侷限面射型雷射中的空間燒洞現象與模態競爭zh_TW
dc.titleSpatial hole burning and mode competition in Oxide-Confined Vertical-Cavity Surface Emitting Lasersen_US
dc.typeThesisen_US
dc.contributor.department電子物理系所zh_TW
顯示於類別:畢業論文