标题: 高效能有机薄膜电晶体与其在感测元件上之运用研究
Study on High Performance Organic Thin Film Transistors and its Application on Sensor Devices
作者: 颜国锡
Yen, Kuo-Hsi
冉晓雯
Zan, Hsiao-Wen
光电工程学系
关键字: 有机薄膜电晶体;五苯;氮化铝;溅镀;感测器;OTFT;Pentacene;AlN;Sputtering;Detector
公开日期: 2008
摘要: 本论文提出一种可制作出高效能有机薄膜晶体的介电材料。我们利用射频溅镀法沉积低温氮化铝薄膜,该低温沉积的氮化铝薄膜具有相当高的输水特性,与并五苯有机薄膜有相近的表面能特性。在研究中,我们首先调变沉积温度来降低氮化铝的表面粗操度与结晶率,当氮化铝的表面粗操度与结晶率随沉积温度而降低时,氮化铝的介电层漏电流、在元件的操作区间内可降低到10-9A/cm2的水准,且介电层厚度也可以近一步降低到100奈米以下。我们亦尝试调控溅镀时的氩气与氮气混合比率来近一步降低氮化铝介电层漏电并提升可靠度。研究中发现,较高氮气的比率可以降低漏电流,且我们进一步发现一个可能与氮空缺相关的缺陷分布将往深层能阶移动,这个近似Poole-Frenkel的缺陷态一但位于较深的能阶,则氮化铝的漏电则可以进一步获得控制。在掌握了氮化铝的介电特性之后,我们在该低温介电层上进行有机薄膜电晶体的制作,我们所制作的氮化铝有机薄膜电晶体可以操作在相当低的电压(小于5V),但具有相当高的场效载子漂移率(大于1.6 cm2/V-sec)与相当优良的次临界摆福(小于0.2 V/decade),与国际上有机薄膜电晶体的领先研究团队的成果相当。另一方面,我们也利用有机薄膜电晶体作为光与氨气体的感测器。在有机薄膜光侦测器的研究中,我们尝试用紫外光来改变介面态、来影响元件对光的响应。我们发现存在于有机薄膜与介电层间的带电缺陷态可能有助于提升对光的响应,在光激发下有助于提升光电流生成而在光激发除后将会延长元件回覆时间。在实验中所获得的有机薄膜光感测器的响应可高达10安培每瓦(A/W),与目前所知的高光响应有机电晶体相当。在有机薄膜气体感测中,我们初步地研究了氨气与有机薄电晶体的反应。我们发现提高环境氨气浓度将会降低电晶体输出电流并提高元件临界电压,并讨论金属接面端与有机薄膜本身在氨气环境下的电阻变化。我们亦发现元件的尺度与通道比例可能是影响气体感测灵敏度的一个因素。最后我们提出一种新颖垂直通道的电晶体结构,并研究改善该新颖元件的关闭区域漏电流并提升元件开关比例的方式。
In this thesis, we proposed a dielectric layer for the application of high performance organic thin film transistors (OTFTs). By using the radio frequency (RF) sputtering system, we deposited the alumni nitride (AlN) film as the dielectric layer under a very low temperature. The low-temperature deposited AlN film is highly hydrophobic and its surface energy is similar to that in pentacene film. In our study, we varied the AlN film deposition temperature to lower the AlN film surface roughness and suppress its crystallization. When the surface roughness and the crystallization decreased with the lowering of deposition temperature, the dielectric leakage current of AlN film can be as low as 10-9A/cm2 when the devices were operated and biased. The AlN dielectric thickness can also be reduced to less than 100nm. Furthermore, we also adjusted the argon (Ar) and nitrogen (N2) ratio during the AlN film sputtering to lower the dielectric leakage and to increase the AlN film reliability. It was also found that higher N2 ratio in sputtering process may lower the AlN dielectric leakage. A nitrogen related vacancy defect may also distribute toward a deeper energy level under higher nitrogen ratio. When the Poole-Frenkel liked defect distribution is situated on deep energy level, which helped to further decrease the AlN dielectric leakage. After we gained the experiments of AlN dielectric leakage control, we fabricated the OTFTs on the AlN dielectric layer. The fabricated OTFT with AlN dielectric layer (AlN-OTFTs) can be operated under a low voltage (less than 5V) with high field effect mobility (more than 1.6cm2/V-sec), and its subthresold swing is still good (less than 0.2V/decade). Besides the development of high performance AlN-OTFTs, we also applied the OTFTs to act as optical and gas sensors. In the study of optical OTFT sensors, we used the ultra violent light (UV-light) to modify the interface states, which may influence the device optical response. It was also found that the charged defect states between the organic film and dielectric layer may help to increase the photo-responsivity in optical OTFT sensors. That will enhance photo-current generation under illumination and prolong the device recovering time when the illumination was removed. The observed photo-responsivity in our organic photo detector can be as high as 10 A/W, which value was similar to that in high performance organic photo detector. In the study of organic thin film gas sensors, we studied the interaction between NH3 and OTFTs primitively. It was found that the OTFT output current will be reduced and the threshold voltage will be increased with the increasing of NH3 concentration. The contact resistance between metal electrode/organic interface and channel resistance were also discussed under different NH3 concentration. The device geometry and channel length may be important factors that influenced the sensitivity of organic gas sensor. Finally, we proposed an novel vertical channel OTFTs. We studied the device leakage properties and improved device leakage current in the device off state region.
URI: http://140.113.39.130/cdrfb3/record/nctu/#GT009324818
http://hdl.handle.net/11536/79214
显示于类别:Thesis


文件中的档案:

  1. 481801.pdf
  2. 481802.pdf
  3. 481803.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.