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dc.contributor.author皮旭庭en_US
dc.contributor.authorPi, Shu-Tingen_US
dc.contributor.author孟心飛en_US
dc.contributor.authorHsin-Fei Mengen_US
dc.date.accessioned2014-12-12T02:57:53Z-
dc.date.available2014-12-12T02:57:53Z-
dc.date.issued2005en_US
dc.identifier.urihttp://140.113.39.130/cdrfb3/record/nctu/#GT009327512en_US
dc.identifier.urihttp://hdl.handle.net/11536/79317-
dc.description.abstract在許多共軛高分子中,電子電洞的對稱不只是在能帶結構上會被發現,在因晶格缺陷所造成的失序結構中也同樣的被發現,但在實驗上卻被廣泛的看到電洞遷移率遠大於電子遷移率的現象。我們提出在空氣中存在了不可避免的氧吸附所造成的電子補捉來解釋此現象。在本文中,我們可以定量的計算出關於吸附以及電子電洞不對稱的許多性質,此外,也引入了一個用來估計原子之間跳越積分的方法。zh_TW
dc.description.abstractElectron-hole symmetry is found to exist not only the band structure but also the defect level caused by structure disorder. The commonly observed higher hole mobility is explained by the electron traps caused by oxygen molecule adsorption. We found that defects will enhance oxygen adsorption and this is a key to electron-hole symmetry breaking. In this paper, we calculate the adsorption and imbalance properties quantitatively . Besides, a method to estimate the hopping integral is also introduced.en_US
dc.language.isoen_USen_US
dc.subject共軛高分子zh_TW
dc.subject遷移率zh_TW
dc.subject電子zh_TW
dc.subject電洞zh_TW
dc.subject不對稱zh_TW
dc.subject對稱破壞zh_TW
dc.subjectconjugated polmeren_US
dc.subjectmobilityen_US
dc.subjectelectronen_US
dc.subjectholeen_US
dc.subjectimbalanceen_US
dc.subjectsymmetry breakingen_US
dc.title共軛高分子中的載子遷移率不對稱zh_TW
dc.titleThe imbalance of Carrier Mobility in Conjugated Polymeren_US
dc.typeThesisen_US
dc.contributor.department物理研究所zh_TW
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