高電場下金原子遷移造成之液晶顯示器驅動晶片失效之研究

Abstract

隨著人類對於聲光影像的娛樂品質需求不斷提升，近年來Liquid Crystal Display(LCD)顯示面板快速地取代傳統的陰極射線管螢幕，同時對於顯示面板的色彩飽和度、反應速度和解析度等功能性需求快速地提高，使得控制LCD面板像素和反應速度的LCD Driver Integrated Circuit，在內引腳間距上加速地往微間距(Fine pitch)發展，同時對於LCD Driver IC在封裝後的可靠性要求更加嚴謹。而在可靠度的議題上，金離子遷移所造成的品質失效問題，因現階段無法完全避免，且生產檢測中無法查覺，須待產品使用一段□間後才會失效，因而更彰顯其重要性。故本實驗主要以模擬LCD Driver IC品質失效的真因是由於金離子遷移所造成，同時針對其所發生金離子遷移的必需機制過程做觀察說明，以利後續預防對策的提出。

As the demand of audio/video entertainment quality rising rapidly, Liquid Crystal Display panel speedily replace the traditional Cathode Ray Tube screens in recent years simultaneously the functional demands of display panel for the color saturation, reaction speed and resolution enhance quickly makes the Inner Lead Bonding pin spacing development on accelerated manner to micro pitch (Fine pitch) through its control of LCD panel pixels and the reaction speed of LCD Driver Integrated Circuit; at the same time the requirement of LCD Driver IC package became more strictly. In the reliability issues, since the Gold migration caused by failure of quality problem cannot be totally avoided at this stage; and cannot be detected on time in the productive detection until the production be used for a period then became failure, it demonstrates the important of reliability. Therefore, the experiment is based on the realistic LCD Driver IC quality failures caused by Gold migration, and for the process to do the necessary observation shows the follow-up prevention