Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Huijben, M. | en_US |
dc.contributor.author | Martin, L. W. | en_US |
dc.contributor.author | Chu, Y. -H. | en_US |
dc.contributor.author | Holcomb, M. B. | en_US |
dc.contributor.author | Yu, P. | en_US |
dc.contributor.author | Rijnders, G. | en_US |
dc.contributor.author | Blank, D. H. A. | en_US |
dc.contributor.author | Ramesh, R. | en_US |
dc.date.accessioned | 2014-12-08T15:10:56Z | - |
dc.date.available | 2014-12-08T15:10:56Z | - |
dc.date.issued | 2008-09-01 | en_US |
dc.identifier.issn | 1098-0121 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1103/PhysRevB.78.094413 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/8376 | - |
dc.description.abstract | Detailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La(0.7)Sr(0.3)MnO(3) films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO(3) (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Critical thickness and orbital ordering in ultrathin La(0.7)Sr(0.3)MnO(3) films | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1103/PhysRevB.78.094413 | en_US |
dc.identifier.journal | PHYSICAL REVIEW B | en_US |
dc.citation.volume | 78 | en_US |
dc.citation.issue | 9 | en_US |
dc.citation.spage | en_US | |
dc.citation.epage | en_US | |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
Appears in Collections: | Articles |