完整後設資料紀錄
DC 欄位語言
dc.contributor.authorHuijben, M.en_US
dc.contributor.authorMartin, L. W.en_US
dc.contributor.authorChu, Y. -H.en_US
dc.contributor.authorHolcomb, M. B.en_US
dc.contributor.authorYu, P.en_US
dc.contributor.authorRijnders, G.en_US
dc.contributor.authorBlank, D. H. A.en_US
dc.contributor.authorRamesh, R.en_US
dc.date.accessioned2014-12-08T15:10:56Z-
dc.date.available2014-12-08T15:10:56Z-
dc.date.issued2008-09-01en_US
dc.identifier.issn1098-0121en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.78.094413en_US
dc.identifier.urihttp://hdl.handle.net/11536/8376-
dc.description.abstractDetailed analysis of transport, magnetism, and x-ray absorption spectroscopy measurements on ultrathin La(0.7)Sr(0.3)MnO(3) films with thicknesses from 3 to 70 unit cells resulted in the identification of a lower critical thickness for a nonmetallic nonferromagnetic layer at the interface with the SrTiO(3) (001) substrate of only three unit cells (similar to 12 angstrom). Furthermore, linear-dichroism measurements demonstrate the presence of a preferred (x(2)-y(2)) in-plane orbital ordering for all layer thicknesses without any orbital reconstruction at the interface. A crucial requirement for the accurate study of these ultrathin films is a controlled growth process, offering the coexistence of layer-by-layer growth and bulklike magnetic/transport properties.en_US
dc.language.isoen_USen_US
dc.titleCritical thickness and orbital ordering in ultrathin La(0.7)Sr(0.3)MnO(3) filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.78.094413en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume78en_US
dc.citation.issue9en_US
dc.citation.spageen_US
dc.citation.epageen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
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