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dc.contributor.authorChou, Shu-Tingen_US
dc.contributor.authorLin, Shih-Yenen_US
dc.contributor.authorTseng, Chi-Cheen_US
dc.contributor.authorChen, Yi-Haoen_US
dc.contributor.authorChen, Cheng-Nanen_US
dc.contributor.authorWu, Meng-Chyien_US
dc.date.accessioned2014-12-08T15:10:59Z-
dc.date.available2014-12-08T15:10:59Z-
dc.date.issued2008-09-01en_US
dc.identifier.issn1041-1135en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LPT.2008.928847en_US
dc.identifier.urihttp://hdl.handle.net/11536/8416-
dc.description.abstractIn this letter, we investigate the performance of single-period InAs-GaAs quantum-dot (QD) infrared photodetectors, in which the single-period QD is sandwiched by different thicknesses of the undoped GaAs confinement layers. By using a 5-nm p-type GaAs layer as a current blocking barrier, the investigated three devices exhibit no response. the highest response, and the medium response, respectively. It is attributed to three different electron occupancy situations in the QD region resulted from the various locations of the Fermi level. A higher barrier for the thermionic emission current is observed for the device with a lower Fermi level in the QD structure. It is attributed to the acceptor-like behavior of the depleted QD such that a higher barrier height would be observed.en_US
dc.language.isoen_USen_US
dc.subjectQuantum dot (QD)en_US
dc.subjectquantum-dot infrared photodetector (QDIP)en_US
dc.titleSingle-Period InAs-GaAs Quantum-Dot Infrared Photodetectorsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LPT.2008.928847en_US
dc.identifier.journalIEEE PHOTONICS TECHNOLOGY LETTERSen_US
dc.citation.volume20en_US
dc.citation.issue17-20en_US
dc.citation.spage1575en_US
dc.citation.epage1577en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000260119600046-
dc.citation.woscount0-
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